AVS2017 TuM Sessions , Tuesday, October 31, 2017 8:00 AM
Tuesday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| 2D+AS+SA+SP-TuM | 2D | 2D Materials Characterization including Microscopy and Spectroscopy |
| AC+AS+SA-TuM | AC | Nuclear Power, Forensics, and Other Applications |
| AS+MI+SS-TuM | AS | Quantitative Surface Analysis: Effective Quantitation Strategies |
| EM+NS-TuM | EM | Nanostructures and Nanometer Films for Electronic and Photonic Devices |
| EW-TuM | EW | Exhibitor Technology Spotlight |
| MI+2D+AC+SA+SS-TuM | MI | Novel Magnetic Order at Interfaces |
| MN+BI+EM+SS+TR-TuM | MN | Microelectromechanics: Relays to RF/Surfaces in Micro- and Nano- Systems |
| NS+EM+MI+SS-TuM | NS | Nanoscale Electronics and Magnetism |
| PB+BI+PS-TuM | PB | Plasma Medicine |
| PS-TuM | PS | Advanced FEOL/Gate Etching |
| SA+MI-TuM | SA | Overcoming the Temporal and Spatial Limits of X-Ray Scattering Methods for In-Situ Analysis |
| SP+AS+MI+NS+SS-TuM | SP | Probing Chemical Reactions at the Nanoscale |
| SS+HC-TuM | SS | Controlling Mechanisms of Surface Chemical Reactions |
| SU+AC+MI+MS-TuM | SU | Critical Materials and Energy Sustainability |
| TF-TuM | TF | Advanced CVD and ALD Processing, ALD Manufacturing and Spatial-ALD |
| VT-TuM | VT | Large Vacuum Systems |