3D Imaging ToF-SIMS for Biology – Are We Living the Dream?

3D Organic Structure Characterization by FIB-TOF Tomography

3D-SIMS Characterization of Dictyostelium Discoideum during Chemotaxis

A Picture Is Worth a Thousand Words: Optimization For ToF-SIMS Tissue Images

Mass Spectrometry Image Fusion: What Works and What Doesn’t

The Benefits and Pitfalls of Image Fusion

Combining XPS Atomic Concentration Data with a ToF-SIMS Chemical Image Map using Image and Data Fusion

Exploring New Sources of High Resolution Data for Image Fusion

Depth Profiling of Inorganic Thin Films Using Large Oxygen Gas Clusters

Sputtering with Large O_n⁺ Cluster Projectiles on Inorganic Surfaces

Current Prospects of Organic Analysis with Ar-GCIB SIMS, from Synthetic Polymers and Organic Devices toward Biological Materials

Molecular Cluster Emission in Sputtering of Amino Acids by Argon Gas-cluster Ions

Argon Cluster Total Sputter Yield: Quartz Crystal Microbalance Measurements and Semi-Empirical Predictive Model

Quantitative Studies of Matrix Effects in Massive Cluster Impact (MCI) Sputtering of Intact Lipid and Peptide Ions

Enhanced Ionisation Using Water-containing Cluster Ion Beams - A Fundamental Study

Comparative Study of Secondary Ion Emission from Organic Thin Film Bombarded with Water, Methanol and Methane Cluster Ions

Investigation of Surface-adsorbate Interaction of Surface-adsorbed (bio-) Molecules Using Desorption/Ionization Induced by Neutral Clusters

Applications Of Tof-Sims For Imaging And Depth Profiling Commercial Materials

FIB ToF-SIMS Tomography of through Silicon vias for 3-D Integration

Demonstration of Crater Wall Imaging as a Useful Tool in Functional Materials Research

Comparison of Conventional Dual Beam SIMS Depth Profiling with FIB/SIMS Cross Section Analysis

Lithiation Mechanisms of Composite Silicon Electrodes Revealed by FIB-TOF-SIMS: A Novel Way for the Study of Local Chemistry and Structure Dynamics in Electrode Materials

Oxide Development of Thermally Grown Oxides in SOFC Interconnect Materials Studied by ToF-SIMS using Isotope and FIB Crater Wall Analysis

MD Simulations of Polymer Sputtering by Large Gas Clusters: Effects of Cluster Nature (Ar, CH₄), incidence angle and sample molecular weight

Development of Ambient SIMS using MeV-energy ion probe

MeV Particles, Huge Impact, Soft Desorption

MeV SIMS – A New Method for the Characterization of Modern Paint Materials