SIMS Based Correlative Microscopy for High Resolution Multi-technique Analysis

Bringing MALDI and SIMS Closer Together with New Ion Beams, Matrices and Sample Preparation

Concerted Mass Spectrometry, A Proof of Principle Approach to Combining LA-ICP-MS with SIMS and TIMS for Nuclear Debris Analysis

Beyond Defect Formation: Characterization of Structural and Electronic Modifications in Graphene due to Plasma Treatment by ToF-SIMS, XPS and Raman

Small-Scale Signals With a Big Impact: Sub-Micron Heterogeneity in Environmental Materials and Biominerals as Imaged by SIMS and APT

Multi-technique Evaluation of Induced Topography while Profiling Organic Samples with Low Energy Cesium Ions

Sputtering-ionization from Free Standing Graphene

Quantitative Evaluation of Oxygen Enhancement of Sputtered Ion Yields in Copper, Aluminum and Silicon Single Crystals Studied using ¹⁸O Implant Calibration of Oxygen Levels

Effect of Oxygen Chemistry in Sputtering Simulations

Projectile Assisted Surface Chemistry: A Possible Route to Enhance Molecular Secondary Ion Yields?

Computer Modeling of Cluster Bombardment of Organic Materials: From Small Molecules to Polymers

Exploration of the Concept of Universality in Sputtering Yields due to Custer Bombardment

SIMS Isotopic Measurements of Isotopically Purified Films Deposited on Silicon

High Depth Resolution SIMS Profiling and Topography Studies of III-V Heterostructures in 3D Architecture under Low Energy Ion Beam Sputtering

Effect of Boron Concentration in High Purity Water on Electrical Properties of Silicon Devices

Assessment of Accurate Analysis in Low Dimensional or Confined SiGe Structures using Low Energy Dynamic Sims Technique

Combining Plasma Profiling ToFMS with ToF-SIMS depth profiling for microelectronic applications

'Atomic Layer’ SIMS Depth Profiling of Epitaxial Si_1-xGe_x Films: Quantification Aspects at Low Impact Energy