Method for Quantification of Insecticide in Mosquito Netting using Ion Implantation and TOF-SIMS Analysis

Depth Profiling the Oxidation State of UO₂ Samples

Light Elements Measurements using the CAMECA IMS 7f-Auto

High Quality Profiles for Inorganic Material using Ar_n⁺ Clusters: A Must for Hybrid System Profiling and How to Achieve Them.

Recent Developments in ToF-SIMS Depth Profiling of Inorganic and Organic Thin Films

Low Energy Cesium Depth Profiling of Hybrid Materials

Surface Analysis and Depth Profiling of Polymer Multilayers by ToF-SIMS and XPS: A Possible Model for Complex Matrices Analysis

Reconstructing Accurate ToF-SIMS Depth Profiles for Organic Materials with Differential Sputter Rates

Ion Formation and the Interpretation of Static SIMS Spectra

The Matrix Effect in SIMS Organic Depth Profiling: A VAMAS Inter-laboratory Comparison

Statistically Rigorous Analysis of Imaging SIMS Data in the Presence of Detector Saturation

Random Projection Based Methods for Rapid Segmentation and Compression of Large SIMS Images

Simultaneous Analysis of Multiple 3D Datasets via Application of MVSA Techniques

Multivariate Analysis of Very Large 2D and 3D ToFSIMS Datasets by a Rapid PCA Method, with Optional Low Discrepancy Subsampling

Variable Scaling in Chemometrics: Reducing Loading Bias Resulting from Widely Varying Ion Yields

ToF-SIMS as a Screening Technique - A Multivariate Data Analysis Approach

Methodology for Analyzing Ultra-Small Nanoparticles

Composition Analysis of III-V Materials Grown in Nanostructures for Semiconductor Applications: the Self Focusing SIMS Approach

Recent Advances in Ultra High Spatial Resolution SIMS with Oxygen Focused Ion Beams

Sub 20 nm SIMS Imaging on the ORION NanoFab

High-Resolution Imaging of the Distributions of Cholesterol and Sphingolipids in Cellular Membranes