Comparing Polyatomic Ion Beams for Mass Spectrometric Imaging of Mouse Brain Tissue by ToF-SIMS

Molecular Mapping of Metabolic Variation within Human Breast Tumors

Drug Delivery Mapping in Cancer Cells using Subcellular Topological Markers and 3D-TOF-SIMS

3D ToF-SIMS Imaging of the Distribution of Drug Compounds in Mammalian and Bacterial Cells

ToF-SIMS Imaging Reveals Species Difference in Drug Uptake in the Small Intestine of Rodents

Alternative Pathways for Generating Breakthroughs in Biological SIMS Imaging

Biological Tissue Imaging using GCIBs and Dynamic Reactive Ionization

Visualizing Pharmaceutical and Metabolite Uptake in Cells with Label-free 3D Mass Spectrometry Imaging

High-Resolution Imaging of Dietary Lipids by the NanoSIMS and Complementary Techniques

Parallel Ion Electron Spectrometry (PIES): A New Multi-Technique Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS

Argon Clusters - a Novel Solution for XPS and UPS Surface Analysis

XPS/UPS Depth Profiling with Gas Cluster Ion Beam for Characterization of Interfaces in Thin Multilayer Organic Structures

XPS Depth Profiling of Organic Photodetectors with the Gas Cluster Ion Beam

Surface Chemical Properties of Fluorocarbon Blended Hydrogels for Controlled Drug Release Applications by X-ray Photoelectron Spectroscopy and Time of Flight Secondary Ion Mass Spectrometry

Validation of a Complementary ToF-SIMS and UHPLC-ESI-MS/MS Method to Study the Release of Polymer Additives from Pharmaceutical Packaging

Towards Accurate Depth Profiling of Nitrogen in Thin Gate Oxides Surrounding Three Dimensional FINFET Structures Using a Multidisciplinary Approach

Determination of Carbon Distributions in a Quenched and Partitioned Steel using Nanoscale Secondary Ion Mass Spectroscopy and Electron Backscatter Diffraction

Chemical Stability of Polymers Under Ar-GCIB and X-ray Irradiation

ToF-SIMS and Multivariate Analysis of Polydimethylsiloxane: study of gamma radiation induced surface modification of silicone breast implant

1.5D SIMS Methodology for Semiconductors Technology Development

Operating the CAMECA NanoSIMS 50L at Reduced Primary Beam Impact Energies for Depth Profile Applications

Mechanism of Oxygen-Induced Segregation of Surface Species during Sputtering

Low Temperature Plasma for Crater Edge Depth Profiling of Inorganic Multilayers

SIMS Measurement of Hydrogen Detection Limit: Comparison of Different SIMS Instrumentation

Creating Depth Profile Standards for Inorganic Materials Using Inkjet Deposition

Study of Alkali Ion Exchange in High-Level Nuclear Waste Glasses using Secondary Ion Mass Spectrometry

Resolve Diffused Species at Interface with 3D-SIMS